Termómetro de infravermelhos testo 835-T2, -10 a +1500 °C, opção de medição por contacto

The testo 835-T2 infrared thermometer measures surface temperatures from -10 to +1500°C using non-contact infrared sensing with an optional contact probe. Designed for industrial maintenance, HVAC and process monitoring, the instrument delivers fast temperature readings across a very wide range and includes optics suited for accurate measurement of small and distant targets. The contact measurement option allows verification where emissivity or surface conditions require direct contact readings. The design supports quick checks on machinery, ovens, bearings, piping and other hard-to-reach or hazardous surfaces.

Advantages

The infrared sensor provides rapid, repeatable temperature readings without physical contact, reducing downtime and exposure to hot or moving parts. A wide measurement range up to 1500°C covers low-temperature HVAC work as well as high-temperature industrial processes. The contact measurement option increases versatility where emissivity adjustments or direct-surface verification are necessary. Built-in optics and targeting aid improve accuracy on small or distant targets, while robust construction and ergonomic controls are intended for reliable use in industrial environments.

Suitable for

Key specifications

How to use

Select infrared mode for non-contact readings and aim the instrument at the target surface, ensuring the field of view covers the area to be measured. Adjust the emissivity setting to match the surface material when accurate absolute temperatures are required. For contact verification, attach the contact probe and place it directly on the surface; allow sufficient time for thermal equilibration before recording the reading. Use the targeting aid or built-in optics to focus on small or distant targets. Read and record values from the digital display and, when necessary, repeat measurements at multiple points to confirm consistency.

Recommendations

For best results, clean the target surface from dust or steam that can affect infrared transmission, select an emissivity value appropriate to the material, and maintain a proper distance so the measured area fits within the device’s optical field of view. Use the contact probe for low-emissivity or highly reflective surfaces and when regulatory or process requirements call for direct contact measurements.